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Record #206981:
Surface effects on the microwave backscatter and emission of snow / A.K. Fung, W.H. Stiles, F.T. Ulaby.
Title: | Surface effects on the microwave backscatter and emission of snow / A.K. Fung, W.H. Stiles, F.T. Ulaby. |
Author(s): | Fung, A. K. Stiles, W. H. Ulaby, F. T. |
Date: | 1980. |
Publisher: | [New York]: Institute of Electrical and Electronic Engineers |
Abstract: | Investigates effects of surface roughness on backscatter and emission from snow. Reports measurements performed with active and passive microwave sensors for both dry and wet snow conditions. Finds layer of Rayleigh scatterers with irregular surface boundaries to be reasonable model for interpreting passive and active measurements in X- and Ku-bands. Finds that roughness had significant effect on both backscatter and emission from wet snow; however, notes only a small effect for dry snow. |
Notes: | Photocopied from: ICC '80. International Conference on Communications, Seattle, Wash., June 8-12, 1980, Conference Record. Vol. 3. (A81-32276 14-32), New York, Institute of Electrical and Electronics Engineers, Inc., 1980. |
Keywords: | 551.32 -- Glaciology. 551.578.46 -- Snow cover and snow patches. 551.322 -- Ice and snow. 551.321.7 -- Snow cover, measurement of properties. 519.673 -- Modelling. 621.396.96 -- Radar. 551.521 -- Radiation, atmospheric. E3 -- Glaciology: instruments and methods. |
Location(s): | SCO: SPRI-PAM: 551.321.7[F] |
SPRI record no.: | 206981 |
LDR 01754nam#a2200000#a#4500 001 SPRI-206981 005 20240329092621.0 007 ta 008 240329s1980####nyua###|#####|0||#0#eng#d 035 ## ‡aSPRI-206981 040 ## ‡aUkCU-P‡beng‡eaacr 100 1# ‡aFung, A. K. 245 10 ‡aSurface effects on the microwave backscatter and emission of snow /‡cA.K. Fung, W.H. Stiles, F.T. Ulaby. 260 ## ‡a[New York] :‡bInstitute of Electrical and Electronic Engineers,‡c1980. 300 ## ‡ap. 49.6.1-49.6.7 :‡bill., diags. 500 ## ‡aPhotocopied from: ICC '80. International Conference on Communications, Seattle, Wash., June 8-12, 1980, Conference Record. Vol. 3. (A81-32276 14-32), New York, Institute of Electrical and Electronics Engineers, Inc., 1980. 520 3# ‡aInvestigates effects of surface roughness on backscatter and emission from snow. Reports measurements performed with active and passive microwave sensors for both dry and wet snow conditions. Finds layer of Rayleigh scatterers with irregular surface boundaries to be reasonable model for interpreting passive and active measurements in X- and Ku-bands. Finds that roughness had significant effect on both backscatter and emission from wet snow; however, notes only a small effect for dry snow. 650 07 ‡a551.32 -- Glaciology.‡2udc 650 07 ‡a551.578.46 -- Snow cover and snow patches.‡2udc 650 07 ‡a551.322 -- Ice and snow.‡2udc 650 07 ‡a551.321.7 -- Snow cover, measurement of properties.‡2udc 650 07 ‡a519.673 -- Modelling.‡2udc 650 07 ‡a621.396.96 -- Radar.‡2udc 650 07 ‡a551.521 -- Radiation, atmospheric.‡2udc 650 07 ‡aE3 -- Glaciology: instruments and methods.‡2local 700 1# ‡aStiles, W. H. 700 1# ‡aUlaby, F. T. 852 7# ‡2camdept‡bSCO‡cSPRI-PAM‡h551.321.7[F]‡9Create 1 item record‡0Migrate 916 ## ‡a81611 -- GX 917 ## ‡aUnenhanced record from Muscat, imported 2019 948 3# ‡a20240329 ‡bGX